Microstructural parameters from X-ray diffraction peak broadening

Research output: Contribution to journalArticle

419 Citations (Scopus)

Abstract

X-ray diffraction peak profiles provide crystallite size, size distribution and dislocation structure. Theoretical size and strain profile functions are given by the minimum number of parameters required by physics and are compared with TEM results. Strain anisotropy gives information about dislocation character and Burgers vector populations. Thermal stability determined by X-rays and calorimetry is discussed for recovery.

Original languageEnglish
Pages (from-to)777-781
Number of pages5
JournalScripta Materialia
Volume51
Issue number8 SPEC. ISS.
DOIs
Publication statusPublished - Oct 2004

Fingerprint

X ray diffraction
Burgers vector
Calorimetry
Crystallite size
profiles
Dislocations (crystals)
diffraction
Anisotropy
Thermodynamic stability
x rays
thermal stability
heat measurement
Physics
recovery
Transmission electron microscopy
Recovery
X rays
transmission electron microscopy
anisotropy
physics

Keywords

  • Dislocation structure
  • Thermal stability
  • X-ray line broadening

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Metals and Alloys

Cite this

Microstructural parameters from X-ray diffraction peak broadening. / Ungár, T.

In: Scripta Materialia, Vol. 51, No. 8 SPEC. ISS., 10.2004, p. 777-781.

Research output: Contribution to journalArticle

@article{172fa38d379d46e4b2777daa2ce74608,
title = "Microstructural parameters from X-ray diffraction peak broadening",
abstract = "X-ray diffraction peak profiles provide crystallite size, size distribution and dislocation structure. Theoretical size and strain profile functions are given by the minimum number of parameters required by physics and are compared with TEM results. Strain anisotropy gives information about dislocation character and Burgers vector populations. Thermal stability determined by X-rays and calorimetry is discussed for recovery.",
keywords = "Dislocation structure, Thermal stability, X-ray line broadening",
author = "T. Ung{\'a}r",
year = "2004",
month = "10",
doi = "10.1016/j.scriptamat.2004.05.007",
language = "English",
volume = "51",
pages = "777--781",
journal = "Scripta Materialia",
issn = "1359-6462",
publisher = "Elsevier Limited",
number = "8 SPEC. ISS.",

}

TY - JOUR

T1 - Microstructural parameters from X-ray diffraction peak broadening

AU - Ungár, T.

PY - 2004/10

Y1 - 2004/10

N2 - X-ray diffraction peak profiles provide crystallite size, size distribution and dislocation structure. Theoretical size and strain profile functions are given by the minimum number of parameters required by physics and are compared with TEM results. Strain anisotropy gives information about dislocation character and Burgers vector populations. Thermal stability determined by X-rays and calorimetry is discussed for recovery.

AB - X-ray diffraction peak profiles provide crystallite size, size distribution and dislocation structure. Theoretical size and strain profile functions are given by the minimum number of parameters required by physics and are compared with TEM results. Strain anisotropy gives information about dislocation character and Burgers vector populations. Thermal stability determined by X-rays and calorimetry is discussed for recovery.

KW - Dislocation structure

KW - Thermal stability

KW - X-ray line broadening

UR - http://www.scopus.com/inward/record.url?scp=3342950347&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3342950347&partnerID=8YFLogxK

U2 - 10.1016/j.scriptamat.2004.05.007

DO - 10.1016/j.scriptamat.2004.05.007

M3 - Article

AN - SCOPUS:3342950347

VL - 51

SP - 777

EP - 781

JO - Scripta Materialia

JF - Scripta Materialia

SN - 1359-6462

IS - 8 SPEC. ISS.

ER -