Microscopic second-order susceptibility tensor analysis

Mikko J. Huttunen, Liisa Naskali, Matti Virkki, Godofredo Bautista, Andras Dér, Martti Kauranen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2013
Publication statusPublished - Dec 1 2013
EventThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2013 - Munich, Germany
Duration: May 12 2013May 16 2013

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2013
CountryGermany
CityMunich
Period5/12/135/16/13

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Huttunen, M. J., Naskali, L., Virkki, M., Bautista, G., Dér, A., & Kauranen, M. (2013). Microscopic second-order susceptibility tensor analysis. In The European Conference on Lasers and Electro-Optics, CLEO_Europe 2013 (Optics InfoBase Conference Papers).