Microscopic second-order susceptibility tensor analysis

Mikko J. Huttunen, Liisa Naskali, Matti Virkki, Godofredo Bautista, A. Dér, Martti Kauranen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
Publication statusPublished - 2013
EventThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2013 - Munich, Germany
Duration: May 12 2013May 16 2013

Other

OtherThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2013
CountryGermany
CityMunich
Period5/12/135/16/13

Fingerprint

tensor analysis
Tensors
magnetic permeability

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Huttunen, M. J., Naskali, L., Virkki, M., Bautista, G., Dér, A., & Kauranen, M. (2013). Microscopic second-order susceptibility tensor analysis. In Optics InfoBase Conference Papers

Microscopic second-order susceptibility tensor analysis. / Huttunen, Mikko J.; Naskali, Liisa; Virkki, Matti; Bautista, Godofredo; Dér, A.; Kauranen, Martti.

Optics InfoBase Conference Papers. 2013.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Huttunen, MJ, Naskali, L, Virkki, M, Bautista, G, Dér, A & Kauranen, M 2013, Microscopic second-order susceptibility tensor analysis. in Optics InfoBase Conference Papers. The European Conference on Lasers and Electro-Optics, CLEO_Europe 2013, Munich, Germany, 5/12/13.
Huttunen MJ, Naskali L, Virkki M, Bautista G, Dér A, Kauranen M. Microscopic second-order susceptibility tensor analysis. In Optics InfoBase Conference Papers. 2013
Huttunen, Mikko J. ; Naskali, Liisa ; Virkki, Matti ; Bautista, Godofredo ; Dér, A. ; Kauranen, Martti. / Microscopic second-order susceptibility tensor analysis. Optics InfoBase Conference Papers. 2013.
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