Microelemental measurement of tomato plants by using PIXE and ICP methods

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Abstract

Five groups of plants were treated with different artificial fertilizers and chemicals, containing N, P, K, Mg, Mn, Cu and Zn in different quantities. Then the leaves of the plants were collected and after preparation they were measured by using PIXE and ICP methods to compare the capability of the two methods.

Original languageEnglish
Pages (from-to)195-197
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume49
Issue number1-4
DOIs
Publication statusPublished - Apr 2 1990

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tomatoes
fertilizers
Fertilizers
leaves
preparation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

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title = "Microelemental measurement of tomato plants by using PIXE and ICP methods",
abstract = "Five groups of plants were treated with different artificial fertilizers and chemicals, containing N, P, K, Mg, Mn, Cu and Zn in different quantities. Then the leaves of the plants were collected and after preparation they were measured by using PIXE and ICP methods to compare the capability of the two methods.",
author = "S. Tak{\'a}cs and F. Ditr{\'o}i and M. Pankotai and P. Fodor",
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AU - Fodor, P.

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AB - Five groups of plants were treated with different artificial fertilizers and chemicals, containing N, P, K, Mg, Mn, Cu and Zn in different quantities. Then the leaves of the plants were collected and after preparation they were measured by using PIXE and ICP methods to compare the capability of the two methods.

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