Method to determine the absorptance of thin films for photovol talc technology

Nathan A. Tomlin, John H. Lehman, Katherine E. Hurst, David B. Tanner, K. Kamarás, Aron Pekker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have demonstrated a novel method to determine optical properties of opaque or semi-transparent films for photovoltaic (PV) applications. Such films may be the basis of transparent conductors or photoconductive material. As an example, we measure the absolute absorptance (at visible and near infrared wavelengths) of an optically thick single-wall carbon nanotube (SWCNT) film by using a pyroelectric detector. This novel method obviates the need for analysis with respect to polarization and associated difficulties of ellipsometry. The Kramers-Kronig relation is used to determine the thick film index of refraction, which we use to calculate the optical properties of thin films as a function of thickness. A transmittance measurement obtained from a thin SWCNT film shows excellent agreement with results from our model.

Original languageEnglish
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages1745-1748
Number of pages4
DOIs
Publication statusPublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

Fingerprint

Talc
Thin films
Carbon nanotubes
Optical properties
Kramers-Kronig relations
Ellipsometry
Refraction
Thick films
Polarization
Infrared radiation
Detectors
Wavelength

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Tomlin, N. A., Lehman, J. H., Hurst, K. E., Tanner, D. B., Kamarás, K., & Pekker, A. (2010). Method to determine the absorptance of thin films for photovol talc technology. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 1745-1748). [5615860] https://doi.org/10.1109/PVSC.2010.5615860

Method to determine the absorptance of thin films for photovol talc technology. / Tomlin, Nathan A.; Lehman, John H.; Hurst, Katherine E.; Tanner, David B.; Kamarás, K.; Pekker, Aron.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 1745-1748 5615860.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tomlin, NA, Lehman, JH, Hurst, KE, Tanner, DB, Kamarás, K & Pekker, A 2010, Method to determine the absorptance of thin films for photovol talc technology. in Conference Record of the IEEE Photovoltaic Specialists Conference., 5615860, pp. 1745-1748, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 6/20/10. https://doi.org/10.1109/PVSC.2010.5615860
Tomlin NA, Lehman JH, Hurst KE, Tanner DB, Kamarás K, Pekker A. Method to determine the absorptance of thin films for photovol talc technology. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 1745-1748. 5615860 https://doi.org/10.1109/PVSC.2010.5615860
Tomlin, Nathan A. ; Lehman, John H. ; Hurst, Katherine E. ; Tanner, David B. ; Kamarás, K. ; Pekker, Aron. / Method to determine the absorptance of thin films for photovol talc technology. Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. pp. 1745-1748
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