Memory effect on CdSe nanocrystals embedded in SiO2 matrix

S. Levichev, P. Basa, Z. Horváth, A. Chahboun, A. G. Rolo, N. P. Barradas, E. Alves, M. J M Gomes

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

CdSe nanocrystals (NCs) embedded in a solid SiO2 matrix were fabricated by RF-sputtering technique. Raman and photoluminescence spectroscopy illustrated the NCs size dependent confinement effect. The CdSe NCs charging effects were electrically characterized by means of capacitance-voltage measurements. A memory effect was demonstrated through memory window measurements.

Original languageEnglish
Pages (from-to)105-108
Number of pages4
JournalSolid State Communications
Volume148
Issue number3-4
DOIs
Publication statusPublished - Oct 2008

Fingerprint

Nanocrystals
nanocrystals
Data storage equipment
matrices
Plasma confinement
Capacitance measurement
Photoluminescence spectroscopy
Voltage measurement
electrical measurement
Sputtering
charging
Raman spectroscopy
sputtering
capacitance
photoluminescence
spectroscopy

Keywords

  • A. Semiconductors
  • B. Magnetron sputtering
  • D. Memory effect
  • D. Recombination and trapping

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Levichev, S., Basa, P., Horváth, Z., Chahboun, A., Rolo, A. G., Barradas, N. P., ... Gomes, M. J. M. (2008). Memory effect on CdSe nanocrystals embedded in SiO2 matrix. Solid State Communications, 148(3-4), 105-108. https://doi.org/10.1016/j.ssc.2008.07.047

Memory effect on CdSe nanocrystals embedded in SiO2 matrix. / Levichev, S.; Basa, P.; Horváth, Z.; Chahboun, A.; Rolo, A. G.; Barradas, N. P.; Alves, E.; Gomes, M. J M.

In: Solid State Communications, Vol. 148, No. 3-4, 10.2008, p. 105-108.

Research output: Contribution to journalArticle

Levichev, S, Basa, P, Horváth, Z, Chahboun, A, Rolo, AG, Barradas, NP, Alves, E & Gomes, MJM 2008, 'Memory effect on CdSe nanocrystals embedded in SiO2 matrix', Solid State Communications, vol. 148, no. 3-4, pp. 105-108. https://doi.org/10.1016/j.ssc.2008.07.047
Levichev, S. ; Basa, P. ; Horváth, Z. ; Chahboun, A. ; Rolo, A. G. ; Barradas, N. P. ; Alves, E. ; Gomes, M. J M. / Memory effect on CdSe nanocrystals embedded in SiO2 matrix. In: Solid State Communications. 2008 ; Vol. 148, No. 3-4. pp. 105-108.
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