Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy

A. Szücs, T. Haraszti, I. Dékány, J. H. Fendler

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Interaction forces have been measured between (i) apposing layers of 2.0 ± 0.05 nm thick polydiallyldimethylammonium chloride, PDDA, self-assembled onto a silicon wafer, silicon-substrate/PDDA, and onto a silicon microparticle, attached to a tipless AMF catilever, SMP-AFM-tip/PDDA; (ii) apposing layers of 2.0 ± 0.05 nm thick montmorillonite, M, platelets, self-assembled onto the silicon-substrate/PDDA (silicon-substrate/PDDA/M) and onto the SMP-AFM-tip/PDDA (SMP-AFM-tip/PDDA/M); (iii) apposing layers of silicon-substrate/PDDA and SMP-AFM-tip/PDDA/M; and (iv) apposing layers of silicon-substrate/PDDA/M and SMP-AFM-tip/PDDA by scanning force microscopy. Interactions between the bare silicon substrate and the bare SMP-AFM-tip and those between the silicon-substrate/PDDA and the bare SMP-AFM-tip have also been measured. The experimentally obtained force/radius vs probe-sample separation distance plots have been fitted to a simple exponential, taking advantage of the Derjaguin approximation for assessing the double-layer force between a charged sphere and a flat surface, and to the DLVO theory using the constant potential numerical approximation (with the exception of ii, where constant charge numerical approximation was used). Values for the adhesion (the pull back) force, Debye-length, and surface potential have also been evaluated.

Original languageEnglish
Pages (from-to)10579-10587
Number of pages9
JournalJournal of Physical Chemistry B
Volume105
Issue number43
DOIs
Publication statusPublished - Nov 1 2001

Fingerprint

Silicon
clays
Atomic force microscopy
Clay
atomic force microscopy
silicon
Substrates
interactions
Bentonite
approximation
clay
polycations
Surface potential
Debye length
Platelets
Clay minerals
Silicon wafers
microparticles
montmorillonite
platelets

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

Cite this

Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy. / Szücs, A.; Haraszti, T.; Dékány, I.; Fendler, J. H.

In: Journal of Physical Chemistry B, Vol. 105, No. 43, 01.11.2001, p. 10579-10587.

Research output: Contribution to journalArticle

@article{86246c9b8d0743868730207f22fd255e,
title = "Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy",
abstract = "Interaction forces have been measured between (i) apposing layers of 2.0 ± 0.05 nm thick polydiallyldimethylammonium chloride, PDDA, self-assembled onto a silicon wafer, silicon-substrate/PDDA, and onto a silicon microparticle, attached to a tipless AMF catilever, SMP-AFM-tip/PDDA; (ii) apposing layers of 2.0 ± 0.05 nm thick montmorillonite, M, platelets, self-assembled onto the silicon-substrate/PDDA (silicon-substrate/PDDA/M) and onto the SMP-AFM-tip/PDDA (SMP-AFM-tip/PDDA/M); (iii) apposing layers of silicon-substrate/PDDA and SMP-AFM-tip/PDDA/M; and (iv) apposing layers of silicon-substrate/PDDA/M and SMP-AFM-tip/PDDA by scanning force microscopy. Interactions between the bare silicon substrate and the bare SMP-AFM-tip and those between the silicon-substrate/PDDA and the bare SMP-AFM-tip have also been measured. The experimentally obtained force/radius vs probe-sample separation distance plots have been fitted to a simple exponential, taking advantage of the Derjaguin approximation for assessing the double-layer force between a charged sphere and a flat surface, and to the DLVO theory using the constant potential numerical approximation (with the exception of ii, where constant charge numerical approximation was used). Values for the adhesion (the pull back) force, Debye-length, and surface potential have also been evaluated.",
author = "A. Sz{\"u}cs and T. Haraszti and I. D{\'e}k{\'a}ny and Fendler, {J. H.}",
year = "2001",
month = "11",
day = "1",
doi = "10.1021/jp010673j",
language = "English",
volume = "105",
pages = "10579--10587",
journal = "Journal of Physical Chemistry B Materials",
issn = "1520-6106",
publisher = "American Chemical Society",
number = "43",

}

TY - JOUR

T1 - Measurements of interaction forces between polycations, between clay nanoplatelets, and between polycations and clay nanoplatelets by atomic force microscopy

AU - Szücs, A.

AU - Haraszti, T.

AU - Dékány, I.

AU - Fendler, J. H.

PY - 2001/11/1

Y1 - 2001/11/1

N2 - Interaction forces have been measured between (i) apposing layers of 2.0 ± 0.05 nm thick polydiallyldimethylammonium chloride, PDDA, self-assembled onto a silicon wafer, silicon-substrate/PDDA, and onto a silicon microparticle, attached to a tipless AMF catilever, SMP-AFM-tip/PDDA; (ii) apposing layers of 2.0 ± 0.05 nm thick montmorillonite, M, platelets, self-assembled onto the silicon-substrate/PDDA (silicon-substrate/PDDA/M) and onto the SMP-AFM-tip/PDDA (SMP-AFM-tip/PDDA/M); (iii) apposing layers of silicon-substrate/PDDA and SMP-AFM-tip/PDDA/M; and (iv) apposing layers of silicon-substrate/PDDA/M and SMP-AFM-tip/PDDA by scanning force microscopy. Interactions between the bare silicon substrate and the bare SMP-AFM-tip and those between the silicon-substrate/PDDA and the bare SMP-AFM-tip have also been measured. The experimentally obtained force/radius vs probe-sample separation distance plots have been fitted to a simple exponential, taking advantage of the Derjaguin approximation for assessing the double-layer force between a charged sphere and a flat surface, and to the DLVO theory using the constant potential numerical approximation (with the exception of ii, where constant charge numerical approximation was used). Values for the adhesion (the pull back) force, Debye-length, and surface potential have also been evaluated.

AB - Interaction forces have been measured between (i) apposing layers of 2.0 ± 0.05 nm thick polydiallyldimethylammonium chloride, PDDA, self-assembled onto a silicon wafer, silicon-substrate/PDDA, and onto a silicon microparticle, attached to a tipless AMF catilever, SMP-AFM-tip/PDDA; (ii) apposing layers of 2.0 ± 0.05 nm thick montmorillonite, M, platelets, self-assembled onto the silicon-substrate/PDDA (silicon-substrate/PDDA/M) and onto the SMP-AFM-tip/PDDA (SMP-AFM-tip/PDDA/M); (iii) apposing layers of silicon-substrate/PDDA and SMP-AFM-tip/PDDA/M; and (iv) apposing layers of silicon-substrate/PDDA/M and SMP-AFM-tip/PDDA by scanning force microscopy. Interactions between the bare silicon substrate and the bare SMP-AFM-tip and those between the silicon-substrate/PDDA and the bare SMP-AFM-tip have also been measured. The experimentally obtained force/radius vs probe-sample separation distance plots have been fitted to a simple exponential, taking advantage of the Derjaguin approximation for assessing the double-layer force between a charged sphere and a flat surface, and to the DLVO theory using the constant potential numerical approximation (with the exception of ii, where constant charge numerical approximation was used). Values for the adhesion (the pull back) force, Debye-length, and surface potential have also been evaluated.

UR - http://www.scopus.com/inward/record.url?scp=0035525948&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035525948&partnerID=8YFLogxK

U2 - 10.1021/jp010673j

DO - 10.1021/jp010673j

M3 - Article

AN - SCOPUS:0035525948

VL - 105

SP - 10579

EP - 10587

JO - Journal of Physical Chemistry B Materials

JF - Journal of Physical Chemistry B Materials

SN - 1520-6106

IS - 43

ER -