Measurement of synchrotron-radiation-excited Kossel patterns

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

Original languageEnglish
Pages (from-to)214-218
Number of pages5
JournalJournal of Synchrotron Radiation
Volume23
DOIs
Publication statusPublished - 2016

Fingerprint

Kossel pattern
Synchrotron radiation
Electron beams
synchrotron radiation
Photons
Pixels
Crystalline materials
Detectors
Radiation
X rays
high resolution
atomic structure
low noise
excitation
dynamic range
counting
pixels
electron beams
detectors
photons

Keywords

  • diffraction
  • fluorescence
  • Kossel pattern

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics
  • Radiation

Cite this

Measurement of synchrotron-radiation-excited Kossel patterns. / Bortel, G.; Faigel, G.; Tegze, M.; Chumakov, A.

In: Journal of Synchrotron Radiation, Vol. 23, 2016, p. 214-218.

Research output: Contribution to journalArticle

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AU - Tegze, M.

AU - Chumakov, A.

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AB - Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

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