MEASUREMENT OF PHASE TRANSITIONS BY PHOTOTHERMAL RADIOMETRY: THE SEMICONDUCTOR-TO-METAL TRANSITION OF VANADIUM(IV) OXIDE, VO2.

Sandor Pekker, Edward M. Eyring

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A new experimental method of investigating phase transitions of solids, photothermal radiometry, is described. The effects of modulation frequency, laser intensity, and heating-cooling rates on the first-order semiconductor-to-metal phase transition of a microcystalline vanadium dioxide sample have been studied. The PTR signal increases with temperature in both phases, and a negative peak occurs at the phase transition. The intensity of signal is inversely proportional to the square root of frequency at laser-beam chopping frequencies lower than 100 Hz, indicating that the sample is thermally thick, and the signal is controlled by the thermal conductivity and the heat capacity and is independent of the optical properties of the material.

Original languageEnglish
Pages (from-to)397-401
Number of pages5
JournalApplied Spectroscopy
Volume40
Issue number3
DOIs
Publication statusPublished - Jan 1 1986

ASJC Scopus subject areas

  • Instrumentation
  • Spectroscopy

Fingerprint Dive into the research topics of 'MEASUREMENT OF PHASE TRANSITIONS BY PHOTOTHERMAL RADIOMETRY: THE SEMICONDUCTOR-TO-METAL TRANSITION OF VANADIUM(IV) OXIDE, VO<sub>2</sub>.'. Together they form a unique fingerprint.

  • Cite this