Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry

Z. Bor, Attila P. Kovács, K. Osvay, R. Szipócs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a simple, accurate and inexpensive interferometric technique based on the spectrally resolved white-light interferometry to determine the group-delay dispersion of optical elements, such as laser crystals and multilayer mirrors. Due to the different dispersion properties of these elements, different evaluation methods of the interference fringes are used for the mirrors and crystals. The reproducibility of our measurements is ±5 fs2 and ±3 % for mirrors and crystals, respectively, with high spectral resolution over a broad spectral range (700-900 nm). These dispersion data are important for the construction of compact femtosecond solid-state lasers.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsS.V. Svechnikov, M.YA. Valakh
Pages132-137
Number of pages6
Volume3359
DOIs
Publication statusPublished - 1997
EventInternational Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro and Quantum Electronics 1997 - Kiev, Ukraine
Duration: May 13 1997May 15 1997

Other

OtherInternational Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro and Quantum Electronics 1997
CountryUkraine
CityKiev
Period5/13/975/15/97

Fingerprint

Optical materials
optical materials
Interferometry
interferometry
mirrors
Crystals
crystals
Group delay
Solid state lasers
Spectral resolution
Optical devices
solid state lasers
spectral resolution
Multilayers
interference
Lasers
evaluation
high resolution
lasers

Keywords

  • Group-delay dispersion
  • Laser crystal
  • Multilayer mirror
  • White-light interferometry

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Bor, Z., Kovács, A. P., Osvay, K., & Szipócs, R. (1997). Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry. In S. V. Svechnikov, & M. YA. Valakh (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3359, pp. 132-137) https://doi.org/10.1117/12.306204

Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry. / Bor, Z.; Kovács, Attila P.; Osvay, K.; Szipócs, R.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / S.V. Svechnikov; M.YA. Valakh. Vol. 3359 1997. p. 132-137.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bor, Z, Kovács, AP, Osvay, K & Szipócs, R 1997, Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry. in SV Svechnikov & MYA Valakh (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3359, pp. 132-137, International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro and Quantum Electronics 1997, Kiev, Ukraine, 5/13/97. https://doi.org/10.1117/12.306204
Bor Z, Kovács AP, Osvay K, Szipócs R. Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry. In Svechnikov SV, Valakh MYA, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3359. 1997. p. 132-137 https://doi.org/10.1117/12.306204
Bor, Z. ; Kovács, Attila P. ; Osvay, K. ; Szipócs, R. / Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry. Proceedings of SPIE - The International Society for Optical Engineering. editor / S.V. Svechnikov ; M.YA. Valakh. Vol. 3359 1997. pp. 132-137
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