Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry

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Abstract

We present a simple, accurate and inexpensive interferometric technique based on the spectrally resolved white-light interferometry to determine the group-delay dispersion of optical elements, such as laser crystals and multilayer mirrors. Due to the different dispersion properties of these elements, different evaluation methods of the interference fringes are used for the mirrors and crystals. The reproducibility of our measurements is ±5 fs2 and ±3 % for mirrors and crystals, respectively, with high spectral resolution over a broad spectral range (700-900 nm). These dispersion data are important for the construction of compact femtosecond solid-state lasers.

Original languageEnglish
Pages (from-to)132-137
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3359
DOIs
Publication statusPublished - Dec 1 1997
EventInternational Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro and Quantum Electronics 1997 - Kiev, Ukraine
Duration: May 13 1997May 15 1997

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Keywords

  • Group-delay dispersion
  • Laser crystal
  • Multilayer mirror
  • White-light interferometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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