Measurement of As diffusivity in Ni2Si thin films

I. Blum, A. Portavoce, D. Mangelinck, R. Daineche, K. Hoummada, J. L. Lábár, V. Carron, J. Bernardini

Research output: Contribution to journalArticle

6 Citations (Scopus)

Fingerprint Dive into the research topics of 'Measurement of As diffusivity in Ni<sub>2</sub>Si thin films'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds