Maximum likelihood estimation of ADC parameters from sine wave test data

László Balogh, Balázs Fodor, Attila Sárhegyi, István Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

The sine wave test is maybe the most important method for characterizing ADC's. By this, the acquisition device is excited with a sinusoidal signal, and a long series of output values is measured. With the help of these observations, the parameters of the DUT can be determined. The general method to do this is the Least Squares (LS). In this paper, we present a similar method using the Maximum Likelihood Estimation (MLE). It is more robust than the LS method, which has nice properties only under special conditions. This maximum likelihood problem is solvable only numerically. For this, a numerical method is presented, and simulation results are given. The main message of this paper is how to handle the problems of the estimation in the best way in order to extract possibly the full information from the measured data, and obtain a robust, effective algorithm.

Original languageEnglish
Title of host publicationProceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing
Publication statusPublished - Dec 1 2007
Event12th IMEKO TC-4 International Workshop on ADC Modelling and Testing - Iasi, Romania
Duration: Sep 18 2007Sep 22 2007

Publication series

NameProceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing

Conference

Conference12th IMEKO TC-4 International Workshop on ADC Modelling and Testing
CountryRomania
CityIasi
Period9/18/079/22/07

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Keywords

  • ADC test
  • Analog-to-digital converter
  • ENOB
  • Effective number of bits
  • IEEE standard 1241-2000
  • Least Squares fit
  • Maximum likelihood estimation
  • Sine wave fitting

ASJC Scopus subject areas

  • Modelling and Simulation

Cite this

Balogh, L., Fodor, B., Sárhegyi, A., & Kollár, I. (2007). Maximum likelihood estimation of ADC parameters from sine wave test data. In Proceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing (Proceedings - 12th IMEKO TC-4 International Workshop on ADC Modelling and Testing).