Magnetic structure of thin films of (formula presented) on Cu(100)/Co by the fully relativistic screened KKR method

L. Szunyogh, L. Szunyogh, J. Zabloudil, P. Weinberger, F. Offi, W. Kuch, J. Kirschner

Research output: Contribution to journalArticle

Abstract

The fully relativistic screened Korringa-Kohn-Rostoker method is used to discuss the electronic structure and magnetic properties of (formula presented) overlayers on Cu(100)/Co. It is found that in this system, energetically low-lying antiferromagnetic configurations most likely are the cause for the experimentally observed antiferromagnetism. In all cases investigated, the ground state corresponds to the (in-plane) ferromagnetic configuration; the (formula presented) overlayers do carry a small (concentration averaged) magnetic moment. In very good agreement with experiment, two overlayer thicknesses, namely, at 3 and 10 ML, are traced, at which either this moment nearly vanishes (3 ML) or different types of antiferromagnetic configurations apply (10 ML).

Original languageEnglish
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume67
Issue number5
DOIs
Publication statusPublished - Feb 28 2003

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Antiferromagnetism
Magnetic structure
Magnetic moments
Ground state
Electronic structure
Magnetic properties
Thin films
thin films
configurations
Experiments
antiferromagnetism
magnetic moments
electronic structure
magnetic properties
moments
ground state
causes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Magnetic structure of thin films of (formula presented) on Cu(100)/Co by the fully relativistic screened KKR method. / Szunyogh, L.; Szunyogh, L.; Zabloudil, J.; Weinberger, P.; Offi, F.; Kuch, W.; Kirschner, J.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 67, No. 5, 28.02.2003.

Research output: Contribution to journalArticle

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AU - Kirschner, J.

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