Long-range internal stresses in cell and subgrain structures of copper during deformation at constant stress

S. Straub, W. Blum, H. J. Maier, T. Ungár, A. Borbély, H. Renner

Research output: Contribution to journalArticle

70 Citations (Scopus)

Abstract

Long-range internal stresses in dislocation cell and subgrain structures were investigated experimentally. The transition of the dislocation structure from cells to subgrains was achieved by deforming copper polycrystals in compression creep tests at constant stress normalized by the shear modulus in the temperature range from 298 K to 633 K. The long-range internal stresses were investigated by two methods. The first one was the evaluation of characteristically asymmetric X-ray line profiles. The internal stresses are the result of the analysis of the X-ray line profiles. The second one was the measurement of local lattice parameters by convergent beam electron diffraction. The internal stresses can be determined from the changes in the local lattice parameters. The results obtained from both methods show that long-range internal stresses of the same type exist in the cell as well as in the subgrain structures.

Original languageEnglish
Pages (from-to)4337-4350
Number of pages14
JournalActa Materialia
Volume44
Issue number11
DOIs
Publication statusPublished - Nov 1996

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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