Logarithmic corrections in the two-dimensional Ising model in a random surface field

M. Pleimling, F. A. Bagaméry, L. Turban, F. Iglói

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In the two-dimensional Ising model weak random surface field is predicted to be a marginally irrelevant perturbation at the critical point. We study this question by extensive Monte Carlo simulations for various strengths of disorder. The calculated effective (temperature or size-dependent) critical exponents fit with the field-theoretical results and can be interpreted in terms of the predicted logarithmic corrections to the pure system's critical behaviour.

Original languageEnglish
Pages (from-to)8801-8809
Number of pages9
JournalJournal of Physics A: Mathematical and General
Volume37
Issue number37
DOIs
Publication statusPublished - Sep 17 2004

Fingerprint

Random Surfaces
Ising model
Ising Model
critical point
Logarithmic
exponents
disorders
perturbation
Critical Behavior
Critical Exponents
Disorder
Critical point
simulation
Monte Carlo Simulation
Perturbation
Temperature
temperature
Dependent
Monte Carlo simulation

ASJC Scopus subject areas

  • Mathematical Physics
  • Physics and Astronomy(all)
  • Statistical and Nonlinear Physics

Cite this

Logarithmic corrections in the two-dimensional Ising model in a random surface field. / Pleimling, M.; Bagaméry, F. A.; Turban, L.; Iglói, F.

In: Journal of Physics A: Mathematical and General, Vol. 37, No. 37, 17.09.2004, p. 8801-8809.

Research output: Contribution to journalArticle

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