Local surface structure and structural properties of As-Se nanolayers studied by synchrotron radiation photoelectron spectroscopy and DFT calculations

O. Kondrat, R. Holomb, N. Popovich, V. Mitsa, M. Veres, A. Csík, N. Tsud, V. Matolín, K. C. Prince

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The surfaces of As20Se80, As40Se60 and As50Se50 films were studied using synchrotron radiation photoelectron spectroscopy and DFT electronic structure calculations. The composition and local structure of the surfaces were determined by curve fitting of the experimental As 3d and Se 3d core levels, and studies show significant Se-enrichment in the top surface layers of the films. The valence band spectra have been interpreted within a model of discrete structural units, giving rise to distinct peaks in the spectra. The interconnection between the surface composition, local structure formation and the features of the valence band spectra of As20Se80, As40Se60 and As50Se50 films is analyzed and discussed in detail.

Original languageEnglish
Pages (from-to)180-185
Number of pages6
JournalJournal of Non-Crystalline Solids
Volume410
DOIs
Publication statusPublished - Feb 15 2015

Fingerprint

Photoelectron spectroscopy
Synchrotron radiation
Discrete Fourier transforms
Surface structure
Structural properties
synchrotron radiation
photoelectron spectroscopy
Valence bands
valence
Core levels
curve fitting
Curve fitting
Electronic structure
surface layers
electronic structure
Chemical analysis

Keywords

  • As-Se nanolayers
  • Chalcogenide glass
  • DFT electronic structure calculations
  • Photoelectron spectroscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Local surface structure and structural properties of As-Se nanolayers studied by synchrotron radiation photoelectron spectroscopy and DFT calculations. / Kondrat, O.; Holomb, R.; Popovich, N.; Mitsa, V.; Veres, M.; Csík, A.; Tsud, N.; Matolín, V.; Prince, K. C.

In: Journal of Non-Crystalline Solids, Vol. 410, 15.02.2015, p. 180-185.

Research output: Contribution to journalArticle

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AU - Kondrat, O.

AU - Holomb, R.

AU - Popovich, N.

AU - Mitsa, V.

AU - Veres, M.

AU - Csík, A.

AU - Tsud, N.

AU - Matolín, V.

AU - Prince, K. C.

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AB - The surfaces of As20Se80, As40Se60 and As50Se50 films were studied using synchrotron radiation photoelectron spectroscopy and DFT electronic structure calculations. The composition and local structure of the surfaces were determined by curve fitting of the experimental As 3d and Se 3d core levels, and studies show significant Se-enrichment in the top surface layers of the films. The valence band spectra have been interpreted within a model of discrete structural units, giving rise to distinct peaks in the spectra. The interconnection between the surface composition, local structure formation and the features of the valence band spectra of As20Se80, As40Se60 and As50Se50 films is analyzed and discussed in detail.

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