Laser interferometric on-line measurement of surface roughness laboratory and plant application in paper industry

E. Lorincz, P. Richter, I. Peczeli, F. Engard

Research output: Contribution to journalArticle

Abstract

Equipment for non-contact on-line determination of surface roughness is presented. Light of a He-Ne laser scattered by the surface of a moving material (e.g.paper) is detected using an interferometer.Laboratory tests gave good correlation between the results of the optical and traditional methods. Plant application made possible to control reproducibility and observe the effect of technological processes.

Original languageEnglish
Pages (from-to)142-144
Number of pages3
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume473
DOIs
Publication statusPublished - Jan 18 1985

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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