Issues of thermal testing of AC LEDs

András Poppe, Bernie Siegal, Gabor Farkas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In this paper we aim at highlighting different aspects of thermal testing of AC LEDs, especially of retrofit LED lamps which are directly driven from the AC mains supply. The main focus is the concept of thermal impedance applied for AC driven LEDs and the AC heating power. The paper gives an overview of the different representations of the thermal impedance then provides estimates of the AC power of LEDs for one of the extreme cases (ideal AC voltage generator driven situation) together with spectra of harmonics of the AC heating power. Definitions and test procedures for the AC thermal impedance of LEDs are suggested along with test environments for AC LED modules as well as for complete retrofit LED lamps.

Original languageEnglish
Title of host publication27th Annual IEEE Semiconductor Thermal Measurement and Management, SEMI-THERM 27 2011
Pages297-304
Number of pages8
DOIs
Publication statusPublished - Jun 2 2011
Event27th Annual IEEE Semiconductor Thermal Measurement and Management, SEMI-THERM 27 2011 - San Jose, CA, United States
Duration: Mar 20 2011Mar 24 2011

Publication series

NameAnnual IEEE Semiconductor Thermal Measurement and Management Symposium
ISSN (Print)1065-2221

Other

Other27th Annual IEEE Semiconductor Thermal Measurement and Management, SEMI-THERM 27 2011
CountryUnited States
CitySan Jose, CA
Period3/20/113/24/11

Keywords

  • AC LED
  • combined thermal and optical testing of LEDs
  • thermal impedance

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Issues of thermal testing of AC LEDs'. Together they form a unique fingerprint.

  • Cite this

    Poppe, A., Siegal, B., & Farkas, G. (2011). Issues of thermal testing of AC LEDs. In 27th Annual IEEE Semiconductor Thermal Measurement and Management, SEMI-THERM 27 2011 (pp. 297-304). [5767214] (Annual IEEE Semiconductor Thermal Measurement and Management Symposium). https://doi.org/10.1109/STHERM.2011.5767214