Investigations on the Formation of RuO2/ZrO2-Based Electrocatalytic Thin Films by Surface Analysis Techniques

J. Kristóf, S. Daolio, A. De Battisti, C. Piccirillo, J. Mihály, E. Horváth

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Secondary ion mass spectrometry (SIMS) was used to follow the evolution of RuO2/ZrO2 film electrodes. The coating mixtures with compositions 20% Ru + 80% Zr and 50% Ru + 50% Zr prepared on titanium supports from isopropanolic solutions of RuCl3 x 3H2O and ZrOCl2 x 8H2O precursors were heated to 200, 300, and 500 °C and analyzed by SIMS. Cl- concentration depth profiles as ion ZrOCl2 precursor in the outer part of the film at low temperature and noble metal content and a rather uniform distribution at elevated temperatures. Zr+/Ru+ ion intensity ratios showed the relative enrichment of ruthenium in the near surface region at 500 °C, while slight accumulation of zirconia at the surface was evidenced for both compositions in harmony with the results of emission FTIR measurements. No reaction between the oxide components or between coatings and support was identified in the systems investigated.

Original languageEnglish
Pages (from-to)1498-1502
Number of pages5
JournalLangmuir
Volume15
Issue number4
Publication statusPublished - 1999

Fingerprint

Surface analysis
Secondary ion mass spectrometry
secondary ion mass spectrometry
Ions
coatings
Thin films
Coatings
Ruthenium
thin films
Precious metals
Titanium
noble metals
Chemical analysis
zirconium oxides
Zirconia
Oxides
ruthenium
ions
titanium
Temperature

ASJC Scopus subject areas

  • Colloid and Surface Chemistry
  • Physical and Theoretical Chemistry

Cite this

Investigations on the Formation of RuO2/ZrO2-Based Electrocatalytic Thin Films by Surface Analysis Techniques. / Kristóf, J.; Daolio, S.; De Battisti, A.; Piccirillo, C.; Mihály, J.; Horváth, E.

In: Langmuir, Vol. 15, No. 4, 1999, p. 1498-1502.

Research output: Contribution to journalArticle

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AU - Horváth, E.

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