Investigations of a simple emissivity meter

P. Szabó, V. Székely

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a simple emissivity meter device with control electronic. The first part of the paper discusses the main laws of the thermal radiation, the structure of the measure chamber of the equipment. We present the two basic measurement methods, and the simple thermal resistance model of the system. The second part deals with the correlation between the half space average emissivity of surfaces and the emissivity measured by the equipment. For this characterisation we made detailed simulations using the FLOTHERM thermal flow simulator software and thermal transient measurements by the T3Ster equipment. The third part describes the method to reduce the settling time of the measurement. The paper is closed by the presentations of the results of the emissivity measurements of several surfaces.

Original languageEnglish
Title of host publicationProceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006
Pages425-430
Number of pages6
Publication statusPublished - 2006
EventInternational Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006 - Gdynia, Poland
Duration: Jun 22 2006Jun 24 2006

Other

OtherInternational Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006
CountryPoland
CityGdynia
Period6/22/066/24/06

Fingerprint

Heat radiation
Heat resistance
Simulators
Hot Temperature

Keywords

  • Cooling
  • Emissivity meter
  • FLOTHERM
  • Settling time

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Szabó, P., & Székely, V. (2006). Investigations of a simple emissivity meter. In Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006 (pp. 425-430). [1706614]

Investigations of a simple emissivity meter. / Szabó, P.; Székely, V.

Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006. 2006. p. 425-430 1706614.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Szabó, P & Székely, V 2006, Investigations of a simple emissivity meter. in Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006., 1706614, pp. 425-430, International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006, Gdynia, Poland, 6/22/06.
Szabó P, Székely V. Investigations of a simple emissivity meter. In Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006. 2006. p. 425-430. 1706614
Szabó, P. ; Székely, V. / Investigations of a simple emissivity meter. Proceedings of the International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2006. 2006. pp. 425-430
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