Investigation on the formation of RuO2 film electrode by secondary ion mass spectrometry

J. Kristóf, S. Daolio, C. Piccirillo, B. Facchin, J. Mink

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

The formation of thermally prepared RuO2 film electrode from hydrated RuCl3 precursor on titanium and nickel supports was followed as a function of the calcination temperature by Secondary Ion Mass Spectrometry (SIMS). The identification of metal, metal oxide and cluster ions as well as organic fragments can contribute substantially to the understanding of the process of film evolution. Concentration depth profiles for some selected species showed that the support material can strongly influence the structure of the coating. Diffusion profiles of the noble metal showed significant differences for different support materials. The results are in agreement with - and complementary to - those of previous thermoanalytical investigations.

Original languageEnglish
Pages (from-to)287-298
Number of pages12
JournalSurface Science
Volume348
Issue number3
DOIs
Publication statusPublished - Mar 10 1996

Keywords

  • Depth profiling
  • Electrocatalysis
  • Oxide film electrode
  • Ruthenium dioxide
  • Secondary ion mass spectroscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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