Investigation of thermally aged samples by magnetic adaptive testing

G. Vértesy, Ivan Tomáš, Satoru Kobayashi, Yasuhiro Kamada

Research output: Contribution to journalArticle

Abstract

Two series of thermally aged Fe-1 wt % Cu alloys were investigated by the method of Magnetic Adaptive Testing, typical by its low required magnetization of the samples. The samples were prepared for modelling neutron irradiation and thermal ageing in nuclear reactor pressure vessels. Sensitive correlation was found between magnetic descriptors and ageing time. Based on these results, Magnetic Adaptive Testing is suggested as a highly promising non-destructive tool for monitoring the influence of irradiation of surveillance samples in pressure vessels of nuclear reactors. Results of the non-destructive magnetic tests were also compared with the destructive mechanical measurements of Vickers hardness.

Original languageEnglish
Pages (from-to)82-85
Number of pages4
JournalJournal of Electrical Engineering
Volume59
Issue number7 SUPPL
Publication statusPublished - 2008

Fingerprint

Nuclear reactors
Pressure vessels
Thermal aging
Neutron irradiation
Vickers hardness
Testing
Magnetization
Aging of materials
Irradiation
Monitoring

Keywords

  • Irradiation embrittlement
  • Magnetic adaptive testing
  • Minor hysteresis loops
  • Nondestructive testing
  • Thermal ageing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Investigation of thermally aged samples by magnetic adaptive testing. / Vértesy, G.; Tomáš, Ivan; Kobayashi, Satoru; Kamada, Yasuhiro.

In: Journal of Electrical Engineering, Vol. 59, No. 7 SUPPL, 2008, p. 82-85.

Research output: Contribution to journalArticle

Vértesy, G, Tomáš, I, Kobayashi, S & Kamada, Y 2008, 'Investigation of thermally aged samples by magnetic adaptive testing', Journal of Electrical Engineering, vol. 59, no. 7 SUPPL, pp. 82-85.
Vértesy, G. ; Tomáš, Ivan ; Kobayashi, Satoru ; Kamada, Yasuhiro. / Investigation of thermally aged samples by magnetic adaptive testing. In: Journal of Electrical Engineering. 2008 ; Vol. 59, No. 7 SUPPL. pp. 82-85.
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