Investigation of the thermal relaxation in glassy Ni80-xFexP20 alloys

B. Fogarassy, A. Böhönyei, Á Cziráki, I. Szabó, Gy Faigel, L. Gránásy, T. Kemény, I. Vincze

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Abstract

Electrical resistivity, dynamical Young's modulus, internal friction, calorimetry, Mössbauer spectroscopy and electron microscopy studies of melt quenched Ni80-xFexP20 (x=0,1,3,5,10 and 20) amorphous alloys are reported. A significant composition dependence of the thermal relaxation is observed which is explained by substantial changes in the electronic structure on alloying.

Original languageEnglish
Pages (from-to)907-912
Number of pages6
JournalJournal of Non-Crystalline Solids
Volume61-62
Issue numberPART 2
DOIs
Publication statusPublished - Jan 1984

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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