Investigation of the decoration processes of thin crystals

V. M. Kosyevich, A. A. Sokol, G. Radnóczi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A technique of vacuum decoration has been developed which enables the simultaneous electron microscopic observation of a crystal and the decorating particles on its surface. Among the fields of application of this technique are: 1) Use of decoration to increase the contrast of the contours of crystalline films and thereby facilitate the determination of their shape and size. 2) Observation of grain boundaries in continuous films in cases where the film thickness is not sufficient to give a suitable diffraction contrast. 3) Visualization of step-structure surfaces and in this way estimation of film thickness to an accuracy of the height of a single step. The simultaneous application of the rotation moire pattern technique and vacuum decoration permits thorough investigation of the internal and surface structure of films. Lattice defects of thin films which result in selective nucleation have already been investigated as well as the possibility and experimental conditions of decorating dislocations, dislocation networks and large-angle grain boundaries.

Original languageEnglish
Pages (from-to)353-361
Number of pages9
JournalActa Physica Academiae Scientiarum Hungaricae
Volume33
Issue number3-4
DOIs
Publication statusPublished - Sep 1973

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film thickness
grain boundaries
crystals
vacuum
nucleation
defects
thin films
diffraction
electrons

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Investigation of the decoration processes of thin crystals. / Kosyevich, V. M.; Sokol, A. A.; Radnóczi, G.

In: Acta Physica Academiae Scientiarum Hungaricae, Vol. 33, No. 3-4, 09.1973, p. 353-361.

Research output: Contribution to journalArticle

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