Sample bias dependent EBIC dislocation contrast measurements revealed 3 characteristic parts of the contrast/bias curve with different origins (drift, diffusion and plasma). The existence of electron-hole plasma, and its influence on dislocation contrast was proved by simultaneous plasma loss/bias measurements.
|Title of host publication||Institute of Physics Conference Series|
|Number of pages||4|
|Publication status||Published - Dec 1 1985|
|Name||Institute of Physics Conference Series|
ASJC Scopus subject areas
- Physics and Astronomy(all)