Investigation of N‐implanted fe single crystals by X‐ray line broadening

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A long tail in the intensity distribution is observed on the smaller angle side of the (002) Bragg reflection. The asymmetric profiles are decomposed into an asymmetric small peak and a symmetric large one which correspond to the N implanted near surface layer and to the adjacent undisturbed Fe matrix, respectively. The changes after heat treatments up to 550 °C are interpreted in terms of variation of N concentration, N diffusion, and lattice defects.

Original languageEnglish
Pages (from-to)839-844
Number of pages6
Journalphysica status solidi (a)
Issue number2
Publication statusPublished - Apr 16 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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