Investigation of diffusion kinetics by Auger electron spectroscopy

Z. Erdélyi, D. L. Beke, J. Bernardini, Ch Girardeaux, A. Rolland

Research output: Contribution to journalArticle

Abstract

A comparative experimental and theoretical mass transport analysis in model metal/metal structures (Ni/Cu and Ag/Cu thin layers) for systems without compound formation was carried out using Auger Electron Spectroscopy. As a result, it was possible to determine the conditions where gain-boundary and/or volume diffusion coefficients can be accurately determined at low temperatures by monitoring the Ag surface segregation kinetics on nanocrystalline Cu films, and the dissolution of ultrathin Ni deposits onto Cu(111) substrates.

Original languageEnglish
Pages (from-to)131-146
Number of pages16
JournalDefect and Diffusion Forum
Volume203-205
Publication statusPublished - 2002

Fingerprint

Auger electron spectroscopy
Auger spectroscopy
electron spectroscopy
Metals
Surface segregation
Kinetics
kinetics
metals
dissolving
Dissolution
Mass transfer
Deposits
diffusion coefficient
deposits
Monitoring
Substrates
Temperature

Keywords

  • Auger technique
  • Diffusion
  • Interface
  • Intermixing
  • Segregation
  • Thin films

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Erdélyi, Z., Beke, D. L., Bernardini, J., Girardeaux, C., & Rolland, A. (2002). Investigation of diffusion kinetics by Auger electron spectroscopy. Defect and Diffusion Forum, 203-205, 131-146.

Investigation of diffusion kinetics by Auger electron spectroscopy. / Erdélyi, Z.; Beke, D. L.; Bernardini, J.; Girardeaux, Ch; Rolland, A.

In: Defect and Diffusion Forum, Vol. 203-205, 2002, p. 131-146.

Research output: Contribution to journalArticle

Erdélyi, Z, Beke, DL, Bernardini, J, Girardeaux, C & Rolland, A 2002, 'Investigation of diffusion kinetics by Auger electron spectroscopy', Defect and Diffusion Forum, vol. 203-205, pp. 131-146.
Erdélyi, Z. ; Beke, D. L. ; Bernardini, J. ; Girardeaux, Ch ; Rolland, A. / Investigation of diffusion kinetics by Auger electron spectroscopy. In: Defect and Diffusion Forum. 2002 ; Vol. 203-205. pp. 131-146.
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