Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge

L. Kövér, M. Novák, S. Egri, I. Cserny, Z. Berényi, J. Tóth, D. Varga, W. Drube, F. Yubero, S. Tougaard, W. S.M. Werner

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

In the quantitative analysis of buried interfaces or the exploration of local electronic structures around component atoms in bulk solids, spectroscopy of transitions in the deep atomic core has an increasingly significant role to play. A key issue in understanding the deep core photoelectron spectra is the identification and separation of the contributions that are attributable to different excitations leading to loss of energy of the emitted photoelectrons. In this work, Ge 1s and 2s photoelectron spectra are analyzed using various models to interpret the measured spectral shapes. A detailed comparison of the results derived from the different approaches is presented.

Original languageEnglish
Pages (from-to)569-573
Number of pages5
JournalSurface and Interface Analysis
Volume38
Issue number4
DOIs
Publication statusPublished - Apr 1 2006

Keywords

  • Extrinsic loss
  • Intrinsic loss
  • X-ray photoelectron spectra

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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    Kövér, L., Novák, M., Egri, S., Cserny, I., Berényi, Z., Tóth, J., Varga, D., Drube, W., Yubero, F., Tougaard, S., & Werner, W. S. M. (2006). Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge. Surface and Interface Analysis, 38(4), 569-573. https://doi.org/10.1002/sia.2134