Internal calibration technique for HREM studies of nanoscale particles

D. Schryvers, C. Goessens, G. Sáfrán, L. Tóth

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)185-186
Number of pages2
JournalMicroscopy Research and Technique
Volume25
Issue number2
DOIs
Publication statusPublished - 1993

Fingerprint

Metric System
Metric system
International System of Units
Silver
Electron microscopy
Calibration
electron microscopy
Electron Microscopy
silver

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Anatomy
  • Instrumentation

Cite this

Internal calibration technique for HREM studies of nanoscale particles. / Schryvers, D.; Goessens, C.; Sáfrán, G.; Tóth, L.

In: Microscopy Research and Technique, Vol. 25, No. 2, 1993, p. 185-186.

Research output: Contribution to journalArticle

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