Interferometric statistical measurement of surface roughness

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A new technique is described that is capable of sensing surface roughness of moving materials. The method is based on analysis of the intensity fluctuations of laser light backscattered at an angle from the surface. The optical correlation length supplied by this method is related to the surface topography through the derivative surface profile. Laboratory and paper plant experiments confirmed the applicability of the optical correlation length technique in the characterization of random surfaces.

Original languageEnglish
Pages (from-to)2778-2784
Number of pages7
JournalApplied Optics
Volume25
Issue number16
Publication statusPublished - Aug 15 1986

Fingerprint

Optical correlation
surface roughness
Surface roughness
Surface topography
Derivatives
topography
Lasers
profiles
Experiments
lasers

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Interferometric statistical measurement of surface roughness. / Lorincz, Emoke; Richter, Peter; Engard, Ferenc.

In: Applied Optics, Vol. 25, No. 16, 15.08.1986, p. 2778-2784.

Research output: Contribution to journalArticle

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