Interface sharpening in miscible Ni/Cu multilayers studied by atom probe tomography

Zoltán Balogh, Mohammed Reda Chellali, Gerd Hendrik Greiwe, Guido Schmitz, Zoltán Erdélyi

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Abstract

Interfaces of Ni/Cu multilayers were studied by atom probe tomography. To this aim, specimens with sharp or artificially smeared interfaces were prepared and investigated before and after annealing at 773 K. Owing to three-dimensional subnanometer resolution of the atom probe, local chemical analysis of layer interfaces becomes possible without interferences of grain boundaries or geometric roughness. In contrast to the classical expectation for a miscible system, but in agreement with more recent theoretical considerations, diffusion reduces the chemical width of the interfaces by up to 50.

Original languageEnglish
Article number181902
JournalApplied Physics Letters
Volume99
Issue number18
DOIs
Publication statusPublished - Oct 31 2011

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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