Increase of carrier-envelope phase noise in water and cryogenically cooled ti: Sapphire amplifiers

R. S. Nagymihaly, P. Jojart, A. Borzsonyi, K. Osvay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CEP drift of ultrashort pulses originating solely from an amplifier is measured. The CEP noise in water cooled amplifiers has thermal origin, while it is induced by the inherent vibration of Ti:Sa upon cryogenical cooling.

Original languageEnglish
Title of host publicationHigh Intensity Lasers and High Field Phenomena, HILAS 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580095
DOIs
Publication statusPublished - Mar 14 2016
EventHigh Intensity Lasers and High Field Phenomena, HILAS 2016 - Long Beach, United States
Duration: Mar 20 2016Mar 22 2016

Other

OtherHigh Intensity Lasers and High Field Phenomena, HILAS 2016
CountryUnited States
CityLong Beach
Period3/20/163/22/16

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Cite this

Nagymihaly, R. S., Jojart, P., Borzsonyi, A., & Osvay, K. (2016). Increase of carrier-envelope phase noise in water and cryogenically cooled ti: Sapphire amplifiers. In High Intensity Lasers and High Field Phenomena, HILAS 2016 OSA - The Optical Society. https://doi.org/10.1364/HILAS.2016.HS3B.4