Incorporating particle symmetry into orientation determination in single-particle imaging

Research output: Contribution to journalArticle

Abstract

In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray freeelectron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles aswell. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

Original languageEnglish
Pages (from-to)512-517
Number of pages6
JournalActa Crystallographica Section A: Foundations and Advances
Volume74
Issue number5
DOIs
Publication statusPublished - Sep 1 2018

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Keywords

  • Coherent diffraction imaging
  • Correlation maximization
  • Intensity distribution
  • Orientation
  • Single-particle imaging
  • Symmetric particles
  • X-ray free-electron lasers

ASJC Scopus subject areas

  • Structural Biology
  • Biochemistry
  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Inorganic Chemistry

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