Incorporating particle symmetry into orientation determination in single-particle imaging

Research output: Contribution to journalArticle

Abstract

In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray freeelectron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles aswell. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

Original languageEnglish
Pages (from-to)512-517
Number of pages6
JournalActa Crystallographica Section A: Foundations and Advances
Volume74
Issue number5
DOIs
Publication statusPublished - Sep 1 2018

Fingerprint

X-Ray Diffraction
Diffraction patterns
Lasers
X-Rays
X ray lasers
Imaging techniques
symmetry
Laser beams
Diffraction
X ray diffraction
diffraction patterns
Experiments
x rays
laser beams
diffraction

Keywords

  • Coherent diffraction imaging
  • Correlation maximization
  • Intensity distribution
  • Orientation
  • Single-particle imaging
  • Symmetric particles
  • X-ray free-electron lasers

ASJC Scopus subject areas

  • Structural Biology
  • Biochemistry
  • Materials Science(all)
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Inorganic Chemistry

Cite this

@article{f97b8fed4e6645e1ac12ad10b94636f3,
title = "Incorporating particle symmetry into orientation determination in single-particle imaging",
abstract = "In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray freeelectron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles aswell. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.",
keywords = "Coherent diffraction imaging, Correlation maximization, Intensity distribution, Orientation, Single-particle imaging, Symmetric particles, X-ray free-electron lasers",
author = "M. Tegze and G. Bortel",
year = "2018",
month = "9",
day = "1",
doi = "10.1107/S2053273318008999",
language = "English",
volume = "74",
pages = "512--517",
journal = "Acta Crystallographica Section A: Foundations and Advances",
issn = "0108-7673",
publisher = "John Wiley and Sons Inc.",
number = "5",

}

TY - JOUR

T1 - Incorporating particle symmetry into orientation determination in single-particle imaging

AU - Tegze, M.

AU - Bortel, G.

PY - 2018/9/1

Y1 - 2018/9/1

N2 - In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray freeelectron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles aswell. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

AB - In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray freeelectron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the orientation of a pattern can be ambiguous. With some modifications, the correlation-maximization method can find the relative orientations of the diffraction patterns for the case of symmetric particles aswell. After convergence, the correlation maps show the symmetry of the particle and can be used to determine the symmetry elements and their orientations. The C factor, slightly modified for the symmetric case, can indicate the consistency of the assembled three-dimensional intensity distribution.

KW - Coherent diffraction imaging

KW - Correlation maximization

KW - Intensity distribution

KW - Orientation

KW - Single-particle imaging

KW - Symmetric particles

KW - X-ray free-electron lasers

UR - http://www.scopus.com/inward/record.url?scp=85052942272&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85052942272&partnerID=8YFLogxK

U2 - 10.1107/S2053273318008999

DO - 10.1107/S2053273318008999

M3 - Article

AN - SCOPUS:85052942272

VL - 74

SP - 512

EP - 517

JO - Acta Crystallographica Section A: Foundations and Advances

JF - Acta Crystallographica Section A: Foundations and Advances

SN - 0108-7673

IS - 5

ER -