In situ STM and AFM characterization of Pd nanoparticle activated SnO 2 sensor surface

Janos Mizsei, Vilho Lantto

Research output: Contribution to conferencePaper

2 Citations (Scopus)

Abstract

In situ atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) studies were made for RF cathode sputtered metal nanolayers on tin-dioxide gas sensor surfaces during the gas sensing process. Our earlier AFM and resistivity measurements revealed the agglomeration of layers during heating. The present in situ AFM and, especially, STM results show a change in the picture quality after hydrogen adsorption, but no changes were found in the grain size during the gas sensing process. As the surface morphology seems to stay unchanged, it may be concluded that the gas response at the exposure is based only on electronic and atomic processes, i.e., changes in work function, surface and interface potential barriers and charge carrier concentration.

Original languageEnglish
Pages673-676
Number of pages4
Publication statusPublished - Dec 1 2004
EventIEEE Sensors 2004 - Vienna, Austria
Duration: Oct 24 2004Oct 27 2004

Other

OtherIEEE Sensors 2004
CountryAustria
CityVienna
Period10/24/0410/27/04

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Keywords

  • Agglomeration
  • Gas sensor
  • In situ STM
  • Nanoparticle
  • Palladium
  • Tin dioxide
  • Ultrathin layer

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Mizsei, J., & Lantto, V. (2004). In situ STM and AFM characterization of Pd nanoparticle activated SnO 2 sensor surface. 673-676. Paper presented at IEEE Sensors 2004, Vienna, Austria.