In situ optical inspection of electrochemical migration during THB tests

Bálint Medgyes, Balázs Illés, Richárd Berényi, G. Harsányi

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

In order to get more information about the process of electrochemical migration (ECM), a novel in situ optical inspection system was developed and tested. The optical inspection system is applicable for real time in situ investigation to observe water condensation and dendrite growth during Thermal Humidity Bias (THB) tests. In this paper, a real time observation of water condensation and dendrite growth is studied on immersion silver (iAg), bare copper (Cu) and galvanic tin (gSn) interdigital (double comb) patterns prepared on FR4 substrate during Dew Point THB test. The real time in situ optical investigations were verified by real time voltage measurements, which are presented in the paper as well. The result shows that the water condensation mainly starts on the metal surface, which is an unexpected phenomenon since the preliminary condition of ECM is the presence of a continuous moisture film between the metallization stripes, e.g. on the surface of the insulation board material.

Original languageEnglish
Pages (from-to)694-700
Number of pages7
JournalJournal of Materials Science: Materials in Electronics
Volume22
Issue number6
DOIs
Publication statusPublished - Jun 2011

Fingerprint

Humidity
humidity
inspection
Condensation
Atmospheric humidity
Dendrites (metallography)
Hot Temperature
Inspection
Optical Devices
Water
condensation
dendrites
Dendrites
Tin
Voltage measurement
water
Metallizing
Time measurement
dew point
Silver

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

In situ optical inspection of electrochemical migration during THB tests. / Medgyes, Bálint; Illés, Balázs; Berényi, Richárd; Harsányi, G.

In: Journal of Materials Science: Materials in Electronics, Vol. 22, No. 6, 06.2011, p. 694-700.

Research output: Contribution to journalArticle

Medgyes, Bálint ; Illés, Balázs ; Berényi, Richárd ; Harsányi, G. / In situ optical inspection of electrochemical migration during THB tests. In: Journal of Materials Science: Materials in Electronics. 2011 ; Vol. 22, No. 6. pp. 694-700.
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