The SMART-I satellite launched by the European Space Agency has traveled to an orbit around the Moon driven by its own ion engine. Because of the characteristics of the ion engine mission required many revolutions to reach the Moon and the time to pass through the radiation belts around the Earth was significant. The spacecraft is exposed to solar protons throughout its mission. In advance the flight in-beam test data was collected to asses the radiation hardness properties of an SRAM, one of the components of the system unit of the satellite. Single Event Upset data is available for this component and Solar Proton Flux was measured by the GOES satellite in Geosynchronous orbit. The aim of this work is to compare the predictions of the in-beam tests and the effects of the in space irradiation of SRAM circuits on board.