### Abstract

To accurately characterize an ADC using the sine-wave histogram test, the input signal has to meet strict conditions: sampling has to be coherent, and the number of periods has to be relative prime to the number of samples (see IEEE standard 1241). Due to the limited precision of the sine frequency and of the sampling frequency, such conditions should be checked from the measured signal. In this paper a new method is presented which is able to check the fulfilment of the above conditions from the output signal, and if the signal fails to fulfil the conditions, the number of samples to be neglected in the measurement can be determined to improve the quality of the histogram test result.

Original language | English |
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Title of host publication | 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing |

Pages | 485-490 |

Number of pages | 6 |

Publication status | Published - 2013 |

Event | 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing - Barcelona, Spain Duration: Jul 18 2013 → Jul 19 2013 |

### Other

Other | 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing |
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Country | Spain |

City | Barcelona |

Period | 7/18/13 → 7/19/13 |

### Fingerprint

### Keywords

- ADC testing
- Histogram test
- Phase distribution
- Sine-wave fit

### ASJC Scopus subject areas

- Electrical and Electronic Engineering

### Cite this

*19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing*(pp. 485-490)

**Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm.** / Pálfi, Vilmos; Kollár, István.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing.*pp. 485-490, 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing, Barcelona, Spain, 7/18/13.

}

TY - GEN

T1 - Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm

AU - Pálfi, Vilmos

AU - Kollár, István

PY - 2013

Y1 - 2013

N2 - To accurately characterize an ADC using the sine-wave histogram test, the input signal has to meet strict conditions: sampling has to be coherent, and the number of periods has to be relative prime to the number of samples (see IEEE standard 1241). Due to the limited precision of the sine frequency and of the sampling frequency, such conditions should be checked from the measured signal. In this paper a new method is presented which is able to check the fulfilment of the above conditions from the output signal, and if the signal fails to fulfil the conditions, the number of samples to be neglected in the measurement can be determined to improve the quality of the histogram test result.

AB - To accurately characterize an ADC using the sine-wave histogram test, the input signal has to meet strict conditions: sampling has to be coherent, and the number of periods has to be relative prime to the number of samples (see IEEE standard 1241). Due to the limited precision of the sine frequency and of the sampling frequency, such conditions should be checked from the measured signal. In this paper a new method is presented which is able to check the fulfilment of the above conditions from the output signal, and if the signal fails to fulfil the conditions, the number of samples to be neglected in the measurement can be determined to improve the quality of the histogram test result.

KW - ADC testing

KW - Histogram test

KW - Phase distribution

KW - Sine-wave fit

UR - http://www.scopus.com/inward/record.url?scp=84894199874&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84894199874&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84894199874

SN - 9781629931890

SP - 485

EP - 490

BT - 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing

ER -