Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm

Vilmos Pálfi, István Kollár

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

To accurately characterize an ADC using the sine-wave histogram test, the input signal has to meet strict conditions: sampling has to be coherent, and the number of periods has to be relative prime to the number of samples (see IEEE standard 1241). Due to the limited precision of the sine frequency and of the sampling frequency, such conditions should be checked from the measured signal. In this paper a new method is presented which is able to check the fulfilment of the above conditions from the output signal, and if the signal fails to fulfil the conditions, the number of samples to be neglected in the measurement can be determined to improve the quality of the histogram test result.

Original languageEnglish
Title of host publication19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
Pages485-490
Number of pages6
Publication statusPublished - 2013
Event19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing - Barcelona, Spain
Duration: Jul 18 2013Jul 19 2013

Other

Other19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing
CountrySpain
CityBarcelona
Period7/18/137/19/13

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Keywords

  • ADC testing
  • Histogram test
  • Phase distribution
  • Sine-wave fit

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Pálfi, V., & Kollár, I. (2013). Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm. In 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing (pp. 485-490)

Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm. / Pálfi, Vilmos; Kollár, István.

19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing. 2013. p. 485-490.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pálfi, V & Kollár, I 2013, Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm. in 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing. pp. 485-490, 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing, Barcelona, Spain, 7/18/13.
Pálfi V, Kollár I. Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm. In 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing. 2013. p. 485-490
Pálfi, Vilmos ; Kollár, István. / Improving histogram test by assuring uniform phase distribution with setting based on a fast sine fit algorithm. 19th IMEKO TC4 Symposium - Measurements of Electrical Quantities 2013 and 17th International Workshop on ADC and DAC Modelling and Testing. 2013. pp. 485-490
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