Improved residual analysis in ADC testing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Analog-to-digital converters are commonly tested by applying a pure sine wave at their inputs. Since the exact parameters of the sine wave are very difficult to precisely obtain, an indirect method is used: the measured samples are used to determine the sine wave which best fits them. The ADC is characterized then by analysis of the differences between the samples and the sine wave. This is described in the IEEE standards 1241-2000 and 1057-1994. The generally applied method for the fit is least squares (LS). If the error (the deviation of the ADC output samples from the true sine wave) is a random sequence, with independent, identically distributed zero-mean samples, the LS fit effectively averages it out. However, when the quantization errors dominate in the observations, this is not true. Strange, systematic errors may arise, which cannot be averaged out. The paper examines these errors, and makes suggestions how to reduce them.

Original languageEnglish
Title of host publication9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications
PublisherIMEKO-International Measurement Federation Secretariat
Pages46-51
Number of pages6
ISBN (Electronic)9781634391856
Publication statusPublished - Jan 1 2004
Event9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications - Athens, Greece
Duration: Sep 29 2004Oct 1 2004

Publication series

Name9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications

Other

Other9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications
CountryGreece
CityAthens
Period9/29/0410/1/04

Keywords

  • ADC test
  • Analog-to-digital converter
  • ENOB
  • Effective number of bits
  • IEEE Standard 1057-1994
  • IEEE Standard 1241-2000
  • Least squares
  • Sine wave fitting

ASJC Scopus subject areas

  • Instrumentation
  • Modelling and Simulation
  • Civil and Structural Engineering

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  • Cite this

    Kollár, I. (2004). Improved residual analysis in ADC testing. In 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications (pp. 46-51). (9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications). IMEKO-International Measurement Federation Secretariat.