TY - GEN

T1 - Improved residual analysis in ADC testing

AU - Kollár, István

PY - 2004/1/1

Y1 - 2004/1/1

N2 - Analog-to-digital converters are commonly tested by applying a pure sine wave at their inputs. Since the exact parameters of the sine wave are very difficult to precisely obtain, an indirect method is used: the measured samples are used to determine the sine wave which best fits them. The ADC is characterized then by analysis of the differences between the samples and the sine wave. This is described in the IEEE standards 1241-2000 and 1057-1994. The generally applied method for the fit is least squares (LS). If the error (the deviation of the ADC output samples from the true sine wave) is a random sequence, with independent, identically distributed zero-mean samples, the LS fit effectively averages it out. However, when the quantization errors dominate in the observations, this is not true. Strange, systematic errors may arise, which cannot be averaged out. The paper examines these errors, and makes suggestions how to reduce them.

AB - Analog-to-digital converters are commonly tested by applying a pure sine wave at their inputs. Since the exact parameters of the sine wave are very difficult to precisely obtain, an indirect method is used: the measured samples are used to determine the sine wave which best fits them. The ADC is characterized then by analysis of the differences between the samples and the sine wave. This is described in the IEEE standards 1241-2000 and 1057-1994. The generally applied method for the fit is least squares (LS). If the error (the deviation of the ADC output samples from the true sine wave) is a random sequence, with independent, identically distributed zero-mean samples, the LS fit effectively averages it out. However, when the quantization errors dominate in the observations, this is not true. Strange, systematic errors may arise, which cannot be averaged out. The paper examines these errors, and makes suggestions how to reduce them.

KW - ADC test

KW - Analog-to-digital converter

KW - ENOB

KW - Effective number of bits

KW - IEEE Standard 1057-1994

KW - IEEE Standard 1241-2000

KW - Least squares

KW - Sine wave fitting

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M3 - Conference contribution

AN - SCOPUS:84910683536

T3 - 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications

SP - 46

EP - 51

BT - 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications

PB - IMEKO-International Measurement Federation Secretariat

T2 - 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications

Y2 - 29 September 2004 through 1 October 2004

ER -