Imaging of morphological changes and phase segregation in doped polymeric semiconductors

Felix Deschler, Daniel Riedel, A. Deák, Bernhard Ecker, Elizabeth Von Hauff, Enrico Da Como

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

Original languageEnglish
Pages (from-to)381-387
Number of pages7
JournalSynthetic Metals
Volume199
DOIs
Publication statusPublished - 2015

Fingerprint

Conjugated polymers
Semiconductor materials
Imaging techniques
Scanning electron microscopy
scanning electron microscopy
polymers
Doping (additives)
Transmission electron microscopy
transmission electron microscopy
electrical resistivity
Polymer films
Surface morphology
saturation
Thin films
Electrons
Monitoring
electrons
tetracyanoquinodimethane
Electric Conductivity
poly(2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta(2,1-b-3,4-b0)dithiophene))-alt-4,7-(2,1,3-benzothiadiazole)

Keywords

  • Conjugated polymer
  • Donor acceptor
  • Doping
  • Electron microscopy
  • TCNQ

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this

Imaging of morphological changes and phase segregation in doped polymeric semiconductors. / Deschler, Felix; Riedel, Daniel; Deák, A.; Ecker, Bernhard; Von Hauff, Elizabeth; Da Como, Enrico.

In: Synthetic Metals, Vol. 199, 2015, p. 381-387.

Research output: Contribution to journalArticle

Deschler, Felix ; Riedel, Daniel ; Deák, A. ; Ecker, Bernhard ; Von Hauff, Elizabeth ; Da Como, Enrico. / Imaging of morphological changes and phase segregation in doped polymeric semiconductors. In: Synthetic Metals. 2015 ; Vol. 199. pp. 381-387.
@article{1604c2a5346c4bfeb72512b3edcb70aa,
title = "Imaging of morphological changes and phase segregation in doped polymeric semiconductors",
abstract = "The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.",
keywords = "Conjugated polymer, Donor acceptor, Doping, Electron microscopy, TCNQ",
author = "Felix Deschler and Daniel Riedel and A. De{\'a}k and Bernhard Ecker and {Von Hauff}, Elizabeth and {Da Como}, Enrico",
year = "2015",
doi = "10.1016/j.synthmet.2014.11.037",
language = "English",
volume = "199",
pages = "381--387",
journal = "Synthetic Metals",
issn = "0379-6779",
publisher = "Elsevier BV",

}

TY - JOUR

T1 - Imaging of morphological changes and phase segregation in doped polymeric semiconductors

AU - Deschler, Felix

AU - Riedel, Daniel

AU - Deák, A.

AU - Ecker, Bernhard

AU - Von Hauff, Elizabeth

AU - Da Como, Enrico

PY - 2015

Y1 - 2015

N2 - The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

AB - The electrical conductivity and morphological characteristics of two conjugated polymers, P3HT and PCPDTBT, p-doped with the strong electron acceptor tetrafluoro-tetracyanoquinodimethane (F4-TCNQ) are studied as a function of dopant concentration. By combining scanning and transmission electron microscopy, SEM and TEM, with electrical characterization, we observe a correlation between the saturation in electrical conductivity and the formation of dopant rich clusters. We demonstrate that SEM is a useful technique to observe imaging contrast for locating doped regions in thin polymer films, while in parallel monitoring the surface morphology. The results are relevant for the understanding of structure property relationships in doped conjugated polymers.

KW - Conjugated polymer

KW - Donor acceptor

KW - Doping

KW - Electron microscopy

KW - TCNQ

UR - http://www.scopus.com/inward/record.url?scp=84919684491&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84919684491&partnerID=8YFLogxK

U2 - 10.1016/j.synthmet.2014.11.037

DO - 10.1016/j.synthmet.2014.11.037

M3 - Article

AN - SCOPUS:84919684491

VL - 199

SP - 381

EP - 387

JO - Synthetic Metals

JF - Synthetic Metals

SN - 0379-6779

ER -