Image processing in the material science or fractal behaviour on the GaAs/electrolyte interface

Ákos Nemcsics, Miklós Schuszter, László Dobos, Péter Turmezei

Research output: Contribution to conferencePaper

2 Citations (Scopus)

Abstract

Here, pattern formation on GaAs (001) surface after electrochemical layer removal with the help of image processing was investigated. The morphology of GaAs surface shown fractal behaviour under non-selective etching conditions. The morphological surface study was carried out using digital image processing of scanning electron microscope data. The surface patterns were segmented by the so called grade of membership method. Fractal properties were estabilished using the box counting method.

Original languageEnglish
DOIs
Publication statusPublished - Dec 1 2008
Event6th International Symposium on Intelligent Systems and Informatics, SISY 2008 - Subotica, Serbia
Duration: Sep 26 2008Sep 27 2008

Other

Other6th International Symposium on Intelligent Systems and Informatics, SISY 2008
CountrySerbia
CitySubotica
Period9/26/089/27/08

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ASJC Scopus subject areas

  • Artificial Intelligence
  • Control and Systems Engineering

Cite this

Nemcsics, Á., Schuszter, M., Dobos, L., & Turmezei, P. (2008). Image processing in the material science or fractal behaviour on the GaAs/electrolyte interface. Paper presented at 6th International Symposium on Intelligent Systems and Informatics, SISY 2008, Subotica, Serbia. https://doi.org/10.1109/SISY.2008.4664942