Identification of lattice vacancies on the two sublattices of SiC

A. A. Rempel, W. Sprengel, K. Blaurock, K. J. Reichle, J. Major, H. E. Schaefer

Research output: Contribution to journalArticle

72 Citations (Scopus)

Abstract

A comprehensive case study for the stringent identificaiton of vacancy defects in binary systems by specific contributions as selective generation of defects and identification of these defects on an atomistic level by making use of positrons as specific local probes. Each of these contributions is indispensable for a trustworthy defect identification. The results reported are thus said to be of importance and broad interest for a reliable electronic assignment of semiconductor defects in terms of band-gap energy levels, for an identification of defects when their origin is unclear as in as-grown compound semiconductors, for the assignment of thermal vacancies and thereby diffusion processes to a particular sublattice for an atomic study of order-disorder processes, etc.

Original languageEnglish
JournalPhysical Review Letters
Volume89
Issue number18
Publication statusPublished - Oct 28 2002

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sublattices
defects
positrons
energy levels
disorders
probes
electronics

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Rempel, A. A., Sprengel, W., Blaurock, K., Reichle, K. J., Major, J., & Schaefer, H. E. (2002). Identification of lattice vacancies on the two sublattices of SiC. Physical Review Letters, 89(18).

Identification of lattice vacancies on the two sublattices of SiC. / Rempel, A. A.; Sprengel, W.; Blaurock, K.; Reichle, K. J.; Major, J.; Schaefer, H. E.

In: Physical Review Letters, Vol. 89, No. 18, 28.10.2002.

Research output: Contribution to journalArticle

Rempel, AA, Sprengel, W, Blaurock, K, Reichle, KJ, Major, J & Schaefer, HE 2002, 'Identification of lattice vacancies on the two sublattices of SiC', Physical Review Letters, vol. 89, no. 18.
Rempel AA, Sprengel W, Blaurock K, Reichle KJ, Major J, Schaefer HE. Identification of lattice vacancies on the two sublattices of SiC. Physical Review Letters. 2002 Oct 28;89(18).
Rempel, A. A. ; Sprengel, W. ; Blaurock, K. ; Reichle, K. J. ; Major, J. ; Schaefer, H. E. / Identification of lattice vacancies on the two sublattices of SiC. In: Physical Review Letters. 2002 ; Vol. 89, No. 18.
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