Identification of Intrinsic Defects in SiC: Towards an Understanding of Defect Aggregates by Combining Theoretical and Experimental Approaches

Michel Bockstedte, Adam Gali, Alexander Mattausch, Oleg Pankratov, John W. Steeds

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationSilicon Carbide
PublisherWiley-VCH
Pages115-145
Number of pages31
Volume1
ISBN (Print)9783527409532
DOIs
Publication statusPublished - Apr 28 2011

Keywords

  • Defect aggregates
  • Experimental approaches
  • Intrinsic defects in SiC
  • Theoretical approaches
  • Vacancy aggregation
  • Vacancy-related defects

ASJC Scopus subject areas

  • Materials Science(all)

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