How to measure accurately mass transport in thin films by AES

C. Girardeaux, G. Clugnet, Z. Erdélyi, J. Nyéki, J. Bernardini, D. Beke, A. Rolland

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In this paper, we show that AES is a powerful technique to determine mass transport in thin films with model metal/metal thin-layer structures (for systems without any compound formation). We show the conditions where grain boundary and/or bulk diffusion coefficients can be determined accurately at unusually low temperatures by monitoring the surface segregation kinetics of an impurity through a nanocrystalline film using the Hwang-Balluffi approach (systems with total solubility), and the dissolution of ultrathin deposits in a matrix using a model based on Martin's kinetic deterministic equations (systems with total solubility).

Original languageEnglish
Pages (from-to)389-392
Number of pages4
JournalSurface and Interface Analysis
Volume34
Issue number1
DOIs
Publication statusPublished - Aug 2002

Fingerprint

Mass transfer
solubility
Solubility
Metals
Surface segregation
Thin films
Kinetics
thin films
kinetic equations
metals
dissolving
Dissolution
Grain boundaries
Deposits
diffusion coefficient
grain boundaries
deposits
Impurities
impurities
Monitoring

Keywords

  • AES
  • Mass transport
  • Thin films

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Girardeaux, C., Clugnet, G., Erdélyi, Z., Nyéki, J., Bernardini, J., Beke, D., & Rolland, A. (2002). How to measure accurately mass transport in thin films by AES. Surface and Interface Analysis, 34(1), 389-392. https://doi.org/10.1002/sia.1323

How to measure accurately mass transport in thin films by AES. / Girardeaux, C.; Clugnet, G.; Erdélyi, Z.; Nyéki, J.; Bernardini, J.; Beke, D.; Rolland, A.

In: Surface and Interface Analysis, Vol. 34, No. 1, 08.2002, p. 389-392.

Research output: Contribution to journalArticle

Girardeaux, C, Clugnet, G, Erdélyi, Z, Nyéki, J, Bernardini, J, Beke, D & Rolland, A 2002, 'How to measure accurately mass transport in thin films by AES', Surface and Interface Analysis, vol. 34, no. 1, pp. 389-392. https://doi.org/10.1002/sia.1323
Girardeaux, C. ; Clugnet, G. ; Erdélyi, Z. ; Nyéki, J. ; Bernardini, J. ; Beke, D. ; Rolland, A. / How to measure accurately mass transport in thin films by AES. In: Surface and Interface Analysis. 2002 ; Vol. 34, No. 1. pp. 389-392.
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