HOT SPOTS IN SEMICONDUCTING FERROELECTRIC CERAMICS.

Gerhard Mader, H. Meixner, Peter Kleinschmidt

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The temperature profiles appearing in barium-titanate ceramic PTC resistors following the application of a voltage were experimentally investigated and theoretically calculated. The temperature response was determined macroscopically by thermography and within single grains by IR microscopy. With high applied fields, neighboring grains exhibited temperature differences up to 50 K during heatup. This was accompanied by high thermal stresses that are liable to destroy the ceramic. A microscopic model for heat dissipation and calculations relating to heat conduction and thermal stresses provides a quite reliable description of the mechanisms inherent in the ceramic.

Original languageEnglish
Pages (from-to)133-139
Number of pages7
JournalSiemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports
Volume14
Issue number3
Publication statusPublished - 1985

Fingerprint

Ferroelectric ceramics
Thermal stress
Barium titanate
Heat losses
Heat conduction
Resistors
Temperature
Microscopic examination
Electric potential

ASJC Scopus subject areas

  • Engineering(all)

Cite this

HOT SPOTS IN SEMICONDUCTING FERROELECTRIC CERAMICS. / Mader, Gerhard; Meixner, H.; Kleinschmidt, Peter.

In: Siemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports, Vol. 14, No. 3, 1985, p. 133-139.

Research output: Contribution to journalArticle

@article{943a12f771af43a79d9d38f8cc7851da,
title = "HOT SPOTS IN SEMICONDUCTING FERROELECTRIC CERAMICS.",
abstract = "The temperature profiles appearing in barium-titanate ceramic PTC resistors following the application of a voltage were experimentally investigated and theoretically calculated. The temperature response was determined macroscopically by thermography and within single grains by IR microscopy. With high applied fields, neighboring grains exhibited temperature differences up to 50 K during heatup. This was accompanied by high thermal stresses that are liable to destroy the ceramic. A microscopic model for heat dissipation and calculations relating to heat conduction and thermal stresses provides a quite reliable description of the mechanisms inherent in the ceramic.",
author = "Gerhard Mader and H. Meixner and Peter Kleinschmidt",
year = "1985",
language = "English",
volume = "14",
pages = "133--139",
journal = "Siemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports",
issn = "0370-9736",
number = "3",

}

TY - JOUR

T1 - HOT SPOTS IN SEMICONDUCTING FERROELECTRIC CERAMICS.

AU - Mader, Gerhard

AU - Meixner, H.

AU - Kleinschmidt, Peter

PY - 1985

Y1 - 1985

N2 - The temperature profiles appearing in barium-titanate ceramic PTC resistors following the application of a voltage were experimentally investigated and theoretically calculated. The temperature response was determined macroscopically by thermography and within single grains by IR microscopy. With high applied fields, neighboring grains exhibited temperature differences up to 50 K during heatup. This was accompanied by high thermal stresses that are liable to destroy the ceramic. A microscopic model for heat dissipation and calculations relating to heat conduction and thermal stresses provides a quite reliable description of the mechanisms inherent in the ceramic.

AB - The temperature profiles appearing in barium-titanate ceramic PTC resistors following the application of a voltage were experimentally investigated and theoretically calculated. The temperature response was determined macroscopically by thermography and within single grains by IR microscopy. With high applied fields, neighboring grains exhibited temperature differences up to 50 K during heatup. This was accompanied by high thermal stresses that are liable to destroy the ceramic. A microscopic model for heat dissipation and calculations relating to heat conduction and thermal stresses provides a quite reliable description of the mechanisms inherent in the ceramic.

UR - http://www.scopus.com/inward/record.url?scp=0021828342&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021828342&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0021828342

VL - 14

SP - 133

EP - 139

JO - Siemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports

JF - Siemens Forschungs- und Entwicklungsberichte/Siemens Research and Development Reports

SN - 0370-9736

IS - 3

ER -