Highly charged ions in exotic atoms research at PSI

D. F. Anagnostopoulos, S. Biri, V. Boisbourdain, M. Demeter, G. Borchert, J. P. Egger, H. Fuhrmann, D. Gotta, A. Gruber, M. Hennebach, P. Indelicato, Y. W. Liu, B. Manil, V. E. Markushin, H. Marton, N. Nelms, A. J. Rusi El Hassani, L. M. Simons, L. Stingelin, A. Wasser & 2 others A. Wells, J. Zmeskal

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

During their de-excitation, exotic atoms formed in low pressure gases reach a state of high or even complete ionization. X-rays emitted from higher n-states of electron-free atoms have well defined energies with the error originating only from the error in the mass values of the constituent particles. They served as a basis for a new determination of the pion mass as well as for a high precision measurement of the pionic hydrogen ground state shift. The response function of the Bragg spectrometer has been determined with X-rays from completely ionized pionic carbon and with a dedicated electron cyclotron resonance ion trap (ECRIT). A further extension of the ECRIT method implemented in the experiment allows a direct calibration of exotic atom transitions as well as a precise determination of the energy of fluorescence lines.

Original languageEnglish
Pages (from-to)9-14
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume205
DOIs
Publication statusPublished - May 2003

Fingerprint

Electron cyclotron resonance
Ions
electron cyclotron resonance
Atoms
atoms
X rays
ions
Ground state
free electrons
Ionization
Spectrometers
Hydrogen
pions
x rays
Carbon
low pressure
Gases
Fluorescence
Calibration
spectrometers

Keywords

  • Crystal spectroscopy
  • ECR
  • Exotic atoms
  • Pion mass
  • Pionic hydrogen

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Highly charged ions in exotic atoms research at PSI. / Anagnostopoulos, D. F.; Biri, S.; Boisbourdain, V.; Demeter, M.; Borchert, G.; Egger, J. P.; Fuhrmann, H.; Gotta, D.; Gruber, A.; Hennebach, M.; Indelicato, P.; Liu, Y. W.; Manil, B.; Markushin, V. E.; Marton, H.; Nelms, N.; Rusi El Hassani, A. J.; Simons, L. M.; Stingelin, L.; Wasser, A.; Wells, A.; Zmeskal, J.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 205, 05.2003, p. 9-14.

Research output: Contribution to journalArticle

Anagnostopoulos, DF, Biri, S, Boisbourdain, V, Demeter, M, Borchert, G, Egger, JP, Fuhrmann, H, Gotta, D, Gruber, A, Hennebach, M, Indelicato, P, Liu, YW, Manil, B, Markushin, VE, Marton, H, Nelms, N, Rusi El Hassani, AJ, Simons, LM, Stingelin, L, Wasser, A, Wells, A & Zmeskal, J 2003, 'Highly charged ions in exotic atoms research at PSI', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 205, pp. 9-14. https://doi.org/10.1016/S0168-583X(03)00536-6
Anagnostopoulos, D. F. ; Biri, S. ; Boisbourdain, V. ; Demeter, M. ; Borchert, G. ; Egger, J. P. ; Fuhrmann, H. ; Gotta, D. ; Gruber, A. ; Hennebach, M. ; Indelicato, P. ; Liu, Y. W. ; Manil, B. ; Markushin, V. E. ; Marton, H. ; Nelms, N. ; Rusi El Hassani, A. J. ; Simons, L. M. ; Stingelin, L. ; Wasser, A. ; Wells, A. ; Zmeskal, J. / Highly charged ions in exotic atoms research at PSI. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003 ; Vol. 205. pp. 9-14.
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AU - Wasser, A.

AU - Wells, A.

AU - Zmeskal, J.

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