Highlighting material structure with transmission electron diffraction correlation coefficient maps

Ákos K. Kiss, Edgar F. Rauch, J. Lábár

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast.

Original languageEnglish
Pages (from-to)31-37
Number of pages7
JournalUltramicroscopy
Volume163
DOIs
Publication statusPublished - Apr 1 2016

Fingerprint

Electron diffraction
correlation coefficients
electron diffraction
Dislocations (crystals)
Diffraction patterns
inclination
Grain boundaries
Electron microscopes
diffraction patterns
grain boundaries
electron microscopes
Scanning
Crystals
scanning
crystals

Keywords

  • Automated crystal orientation mapping (ACOM)
  • Correlation coefficient map
  • Electron diffraction
  • Transmission electron microscopy (TEM)

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Highlighting material structure with transmission electron diffraction correlation coefficient maps. / Kiss, Ákos K.; Rauch, Edgar F.; Lábár, J.

In: Ultramicroscopy, Vol. 163, 01.04.2016, p. 31-37.

Research output: Contribution to journalArticle

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