Highlighting material structure with transmission electron diffraction correlation coefficient maps

Ákos K. Kiss, Edgar F. Rauch, J. Lábár

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast.

Original languageEnglish
Pages (from-to)31-37
Number of pages7
JournalUltramicroscopy
Volume163
DOIs
Publication statusPublished - Apr 1 2016

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Keywords

  • Automated crystal orientation mapping (ACOM)
  • Correlation coefficient map
  • Electron diffraction
  • Transmission electron microscopy (TEM)

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

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