High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP

S. Nagy, T. Fritioff, I. Bergström, K. Blaum, M. Suhonen, A. Solders, R. Schuch

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The Penning trap mass spectrometer SMILETRAP takes advantage of highly-charged ions for high-accuracy mass measurements. In this paper recent mass measurements on Li and Ca ions are presented and their impact on fundamental applications discussed, especially the need for accurate mass values of hydrogen-like and lithium-like ions in the evaluation of the electron g-factor measurements in highly-charged ions is emphasized. Such experiments aim to test bound state quantum electrodynamics. Here the ionic mass is a key ingredient, which can be the limiting factor for the final precision.

Original languageEnglish
Article number018
Pages (from-to)109-112
Number of pages4
JournalJournal of Physics: Conference Series
Volume58
Issue number1
DOIs
Publication statusPublished - Mar 1 2007

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ions
quantum electrodynamics
ingredients
mass spectrometers
lithium
traps
evaluation
hydrogen
electrons

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP. / Nagy, S.; Fritioff, T.; Bergström, I.; Blaum, K.; Suhonen, M.; Solders, A.; Schuch, R.

In: Journal of Physics: Conference Series, Vol. 58, No. 1, 018, 01.03.2007, p. 109-112.

Research output: Contribution to journalArticle

Nagy, S. ; Fritioff, T. ; Bergström, I. ; Blaum, K. ; Suhonen, M. ; Solders, A. ; Schuch, R. / High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP. In: Journal of Physics: Conference Series. 2007 ; Vol. 58, No. 1. pp. 109-112.
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