High fluence ion beam modification of polymer surfaces: EPR and XPS studies

V. N. Popok, I. I. Azarko, V. B. Odzhaev, A. Tóth, R. I. Khaibullin

Research output: Contribution to journalConference article

30 Citations (Scopus)

Abstract

Polyethylene, polyamide-6 and polyimide foils implanted with 100 keV B+, P+ and Sb+ ions to a fluence range of 1015-1017 cm-2 have been studied using the electron paramagnetic resonance (EPR) and X-ray photoelectron spectroscopy (XPS) methods. The experimental data allow the comparison of the implantation-induced changes both in a given polymer foil under different ion beam regimes and in different polymers under similar ion-bombardment conditions. The high fluence implantation of boron ions, depositing energy mainly via electronic stopping, was found to be accompanied with the effective formation of π-bonded carbon-rich clusters. By contrast, heavier (phosphorus and antimony) ions, which deposit energy predominantly in nuclear collisions, produced a lower concentration of π-radicals and a less carbonised top surface layer. The peculiarities and main trends of the alterations of the polymer structure and composition induced via electronic and nuclear stopping have also been discussed.

Original languageEnglish
Pages (from-to)305-310
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume178
Issue number1-4
DOIs
Publication statusPublished - May 1 2001
EventMaterials Science with Ion Beams - Strasbourg, France
Duration: May 30 2000Jun 2 2000

    Fingerprint

Keywords

  • Electron paramagnetic resonance
  • Ion implantation
  • Nuclear and electronic stopping
  • Polymers
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this