Growth structure investigation of MgF2 and NdF3 films grown by molecular beam deposition on CaF2 (111) substrates

U. Kaiser, M. Adamik, G. Sáfrán, P. Barna, S. Laux, W. Richter

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

The growth structure of MgF2 and NdF3 films grown on polished CaF2(111) substrates deposited by molecular beam deposition has been investigated using transmission electron microscopy (TEM) of microfractographical and surface replications as well as cross-sectional TEM, atomic force microscopy, packing density, and absorption measurements. It has been shown that by taking advantage of ultrahigh vacuum environments and a special stratification property of MgF2 and NdF3 films, the preparation of nanocrystalline films of high packing density and low optical absorption is possible at a substrate temperature of 425 K.

Original languageEnglish
Pages (from-to)5-15
Number of pages11
JournalThin Solid Films
Volume280
Issue number1-2
Publication statusPublished - Jul 1996

Fingerprint

Molecular beams
molecular beams
packing density
Substrates
Transmission electron microscopy
transmission electron microscopy
Ultrahigh vacuum
stratification
Light absorption
ultrahigh vacuum
Atomic force microscopy
optical absorption
atomic force microscopy
preparation
Temperature
temperature

Keywords

  • Deposition process
  • Nanocrystalline
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Growth structure investigation of MgF2 and NdF3 films grown by molecular beam deposition on CaF2 (111) substrates. / Kaiser, U.; Adamik, M.; Sáfrán, G.; Barna, P.; Laux, S.; Richter, W.

In: Thin Solid Films, Vol. 280, No. 1-2, 07.1996, p. 5-15.

Research output: Contribution to journalArticle

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AU - Laux, S.

AU - Richter, W.

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