Growth and structural characterization of single-crystal (001) oriented MoV superlattices

J. Birch, Y. Yamamoto, L. Hultman, G. Radnóczi, J. E. Sundgren, L. R. Wallenberg

Research output: Contribution to journalArticle

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Abstract

Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ≤ 4.9 nm and Ts ≤ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites in both XRD and selected area electron diffraction (SAED), and contrast from the individual layers was also observed in HRXTEM images. For λ > 4.9 nm, HRXTEM images showed non-uniform layers and the XRD peak width (FWHM) increased by 250%.

Original languageEnglish
Pages (from-to)1231-1233
Number of pages3
JournalVacuum
Volume41
Issue number4-6
DOIs
Publication statusPublished - 1990

Fingerprint

Superlattices
superlattices
sharpness
Single crystals
X ray diffraction
single crystals
diffraction
x rays
Full width at half maximum
Electron diffraction
Magnetron sputtering
Monolayers
magnetron sputtering
electron diffraction
Modulation
Satellites
Transmission electron microscopy
modulation
Wavelength
transmission electron microscopy

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Birch, J., Yamamoto, Y., Hultman, L., Radnóczi, G., Sundgren, J. E., & Wallenberg, L. R. (1990). Growth and structural characterization of single-crystal (001) oriented MoV superlattices. Vacuum, 41(4-6), 1231-1233. https://doi.org/10.1016/0042-207X(90)93919-A

Growth and structural characterization of single-crystal (001) oriented MoV superlattices. / Birch, J.; Yamamoto, Y.; Hultman, L.; Radnóczi, G.; Sundgren, J. E.; Wallenberg, L. R.

In: Vacuum, Vol. 41, No. 4-6, 1990, p. 1231-1233.

Research output: Contribution to journalArticle

Birch, J, Yamamoto, Y, Hultman, L, Radnóczi, G, Sundgren, JE & Wallenberg, LR 1990, 'Growth and structural characterization of single-crystal (001) oriented MoV superlattices', Vacuum, vol. 41, no. 4-6, pp. 1231-1233. https://doi.org/10.1016/0042-207X(90)93919-A
Birch, J. ; Yamamoto, Y. ; Hultman, L. ; Radnóczi, G. ; Sundgren, J. E. ; Wallenberg, L. R. / Growth and structural characterization of single-crystal (001) oriented MoV superlattices. In: Vacuum. 1990 ; Vol. 41, No. 4-6. pp. 1231-1233.
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