A Michelson interferometer illuminated by a polychromatic light source was used to measure the time of flight of a light pulse (or intensity substructure) through a sample of optical material. In this way the group index of optical materials (fused silica and Schott glass F3) was measured with an accuracy of 10-4. The method can be also applied for measurement of the dispersive properties of optical fibers.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering