Group refractive index measurement by Michelson interferometer

Z. Bor, K. Osvay, B. Rácz, G. Szabó

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Abstract

A Michelson interferometer illuminated by a polychromatic light source was used to measure the time of flight of a light pulse (or intensity substructure) through a sample of optical material. In this way the group index of optical materials (fused silica and Schott glass F3) was measured with an accuracy of 10-4. The method can be also applied for measurement of the dispersive properties of optical fibers.

Original languageEnglish
Pages (from-to)109-112
Number of pages4
JournalOptics Communications
Volume78
Issue number2
DOIs
Publication statusPublished - Aug 15 1990

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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